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Journal article

Management of the electrical injection uniformity in broad-area top-emitting VCSELs

The electrical properties of broad-area 850 nm top emitting VCSELs have been investigated in order to improve carrier injection uniformity in their active zone. First, we have demonstrated using an electrical simulation tool that a multi-point localized injection design associated with a spreading layer at the top of the device (ITO) can lead to a significant improvement of carrier injection and on its spatial distribution.

Secondly, the electrical contrast achievable by applying this method with localized etchings has been experimentally measured. Finally, stripe-shaped devices with output power up to 50 mW in a continuous-wave operation at room temperature have been demonstrated.

Language: English
Publisher: Springer-Verlag
Year: 2010
Pages: 53-57
Journal subtitle: Atomic, Molecular, Optical and Plasma Physics
ISSN: 14346079 and 14346060
Types: Journal article
DOI: 10.1140/epjd/e2010-00149-9

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