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Conference paper

Complete deformaton analysis of transparent samples using digital shearography and holography

In 9. International Symposium on Laser Metrology — 2008, pp. 15536-15536

By Catalan, Francesca Celine I.1; Santos, Raphael D.1; Almoro, Percival2,3,4

Edited by Asundi, A.; Quan, C.

From

University of the Philippines Diliman1

Department of Photonics Engineering, Technical University of Denmark2

Risø National Laboratory for Sustainable Energy, Technical University of Denmark3

Optical Sensor Technology, Department of Photonics Engineering, Technical University of Denmark4

Language: English
Publisher: SPIE - International Society for Optical Engineering
Year: 2008
Pages: 15536-15536
Proceedings: 9th International Symposium on Laser Metrology
Series: Spie Proceedings Series, 7155
Types: Conference paper

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