Journal article
Direct characterization of ultraviolet-light-induced refractive index structures by scanning near-field optical microscopy
In
I E E E Photonics Technology Letters
—
1998, Volume 10, Issue 6, pp. 848-850
Abstract
We have applied a reflection scanning near-field optical microscope to directly probe ultraviolet (UV)-light-induced refractive index structures in planar glass samples. This technique permits direct comparison between topography and refractive index changes (10(-5)-10(-3)) with submicrometer lateral resolution, The proposed method yields detailed information about the topography and index profiles of UV-written waveguides.
| Language: | English |
|---|---|
| Publisher: | IEEE |
| Year: | 1998 |
| Pages: | 848-850 |
| ISSN: | 19410174 and 10411135 |
| Types: | Journal article |
| DOI: | 10.1109/68.681506 |
