Conference paper
Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell
We subjected P3HT:PCBM solar cells to electrical constant current stress and thermal storage. We employed the impedance spectroscopy technique combined to conventional DC measurements for device characterization during all stresses. We identified and separated different contributions affecting the open circuit voltage and short circuit current.
Several mechanisms are behind these changes during the stresses; in particular, we underlined the exciton recombination rate and the variation of the built-in voltage.
| Language: | English |
|---|---|
| Publisher: | IEEE |
| Year: | 2016 |
| Pages: | 3C-2-1-3C-2-6 |
| Proceedings: | 2016 IEEE International Reliability Physics Symposium |
| Series: | I E E E International Reliability Physics Symposium. Proceedings |
| ISBN: | 1467391379 , 1467391387 , 9781467391375 and 9781467391382 |
| ISSN: | 15417026 and 19381891 |
| Types: | Conference paper |
| DOI: | 10.1109/IRPS.2016.7574523 |
| ORCIDs: | Krebs, Frederik C and Gevorgyan, Suren |
Current measurement DC measurements Lighting Photoconductivity Photovoltaic cells Short-circuit currents Thermal stresses built-in voltage variation device characterization electrical constant current stress exciton recombination rate impedance spectroscopy technique open circuit voltage polymeric heterojunction P3HT:PCBM solar cell short circuit current solar cells thermal storage
