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Interpreted as:
title:(Calibrated AND atomic AND force AND microscope AND measurements AND of AND vickers AND hardness AND indentations AND and AND tip AND production AND and AND characterisation AND for AND scanning AND tunelling AND microscope)
Suggestions: Include records that partially match the query
IPL — 1998
Year: 1998
Language: English
DFM, DTU — 1998
Year: 1998
Language: English