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Interpreted as:

title:(Calibrated AND atomic AND force AND microscope AND measurements AND of AND vickers AND hardness AND indentations AND and AND tip AND production AND and AND characterisation AND for AND scanning AND tunelling AND microscope)

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1 PhD Thesis

Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope

Jensen, Carsten P.

IPL — 1998

Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope

Year: 1998

Language: English

ol cie jkabgfmdhpn
2 Book

MM98.66 - Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope

Jensen, Carsten P.

DFM, DTU — 1998

Year: 1998

Language: English

ec dphnl bmof gaikj

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