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Journal article

Aberration-corrected imaging of active sites on industrial catalyst nanoparticles

By Gontard, Lionel Cervera1; Chang, L-Y; Hetherington, CJD; Kirkland, AI; Ozkaya, D; Dunin-Borkowski, Rafal E1

From

Center for Electron Nanoscopy, Technical University of Denmark1

Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented). © 2007 Wiley-VCH Verlag GmbH & Co.

KGaA.

Language: English
Publisher: WILEY-VCH Verlag
Year: 2007
Pages: 3683-3685
ISSN: 05700833 , 15213773 and 14337851
Types: Journal article
DOI: 10.1002/anie.200604811
Keywords

Binding Sites Catalysis Microscopy, Electron, Transmission Nanoparticles Particle Size Platinum Sensitivity and Specificity Surface Properties

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