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1 Preprint article · Journal article

Electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2 determined by polarized x-ray spectroscopy and Seebeck measurements

Magnuson, Martin; Mattesini, Maurizio; Van Nong, Ngo; Eklund, Per; Hultman, Lars

Physical Review B Condensed Matter — 2012, Volume 85, Issue 19, pp. 13

value of 4–6 μV/K. Employing a combination of polarized angle-dependent x-ray spectroscopy and density functional theory we directly show electronic structure anisotropy in inherently nanolaminated Ti3SiC2 single-crystal thin films as a model system. The density of Ti 3d and C 2p states at the Fermi

Year: 2012

Language: English

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poe mfdl chibgnak j
2 Conference paper

The electronic-structure origin of the anisotropic thermopower of nanolaminated Ti3SiC2 determined by polarized x-ray spectroscopy and Seebeck measurements

Magnuson, Martin; Mattesini, Maurizio; Van Nong, Ngo; Eklund, Per; Hultman, Lars

Proceedings - 37th International Conference and Expo on Advanced Ceramics and Composites (icacc 2013) — 2013

Year: 2013

Language: English

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hlacp k bmdgjnofie

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