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1 Conference paper

Evaluation of Ion Beam Spectra for Surface Analysis of Probes Exposed in Fusion Devices

Børgesen, P.; Behrisch, R.; Scherzer, B. M. U.

Nuclear Physics Methods in Materials Research — 1980, pp. 363-366

Year: 1980

Language: English

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jebom apfgldi chkn
2 Book chapter

Evaluation of Ion Beam Spectra for Surface Analysis of Probes Exposed in Fusion Devices

Børgesen, P.; Behrisch, R.

Nuclear Physics Methods in Materials Research — 1980, pp. 363-366

A computer programme has been developed which allows to evaluate a large number of ion beam spectra from different samples taken for the same geometry and conditions of the analysing beam. The programme calculates the depth profiles of different elements in the target both from Rutherford

Year: 1980

Language: English

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pion gdkebjl cf hma

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