Conference paper
JEM-X: The X-ray monitor on INTEGRAL
The INTEGRAL X-ray monitor, JEM-X, (together with the two gamma ray instruments, SPI and IBIS) provides simultaneous imaging with arcminute angular resolution in the 3-35 keV band. The good angular resolution and low energy response of JEM-X plays an important role in the detection and identification of gamma ray sources as well as in the analysis and scientific interpretation of the combined X-ray and gamma ray data.
JEM-X is a coded aperture X-ray telescope consisting of two identical detectors. Each detector has a sensitive area of 500 cm(2), and views the sky through its own coded aperture mask. The coded masks are located 3.4 m above the detector windows. The detector field of view is constrained by X-ray collimators (6.6degrees FOV, FWHM).
| Language: | English |
|---|---|
| Publisher: | SPIE |
| Year: | 2004 |
| Pages: | 139-150 |
| Proceedings: | X-ray and Gamma-ray Instrumentation for Astronomy XIII |
| Series: | Proceedings of Spie - the International Society for Optical Engineering |
| ISBN: | 0819450383 and 9780819450388 |
| ISSN: | 1996756x and 0277786x |
| Types: | Conference paper |
| DOI: | 10.1117/12.506791 |
| ORCIDs: | Budtz-Jørgensen, Carl , Lund, Niels , Westergaard, Niels Jørgen Stenfeldt , Brandt, Søren Kristian , Hornstrup, Allan , Rasmussen, Ib Lundgaard , Oxborrow, Carol Anne and Chenevez, Jérôme |
