About

Log in?

DTU users get better search results including licensed content and discounts on order fees.

Anyone can log in and get personalized features such as favorites, tags and feeds.

Log in as DTU user Log in as non-DTU user No thanks

DTU Findit

Conference paper

Optical constants in the hard X-ray/Soft gamma ray range of selected materials for multilayer reflectors

In Optics for Euv, X-ray, and Gamma-ray Astronomy Iii — 2007
From

Astrophysics, National Space Institute, Technical University of Denmark1

National Space Institute, Technical University of Denmark2

Future Astrophysics missions operating in the hard X-ray/Soft Gamma ray range is slated to carry novel focusing telescopes based on the use of depth graded multilayer reflectors. Current design studies show that, at the foreseen focal lengths, it should be feasible to focus X-rays at energies as high as 300 keV.

These designs use extrapolations of theoretical and experimentally determined optical constants from below 200 keV. In this paper we report on the first experimental determination of optical constants up to and above 200 keV. We present these first results as obtained at the National Synchrotron Light Source in Brookhaven and compare these to results obtained previously up to 180 keV of some of the same materials at the European Synchrotron Radiation Facility in Grenoble.

Language: English
Publisher: Spie-int Soc Optical Engineering
Year: 2007
Proceedings: Optics for EUV, X-Ray, and Gamma-Ray Astronomy III
ISBN: 0819468363 and 9780819468369
Types: Conference paper
ORCIDs: Christensen, Finn Erland

DTU users get better search results including licensed content and discounts on order fees.

Log in as DTU user

Access

Analysis