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Conference paper

Hard X-ray characterisation of a HEFT single reflection prototype

In Proceedings of the Spie Meeting — 2000, pp. 626-638
From

Astrophysics, National Space Institute, Technical University of Denmark1

National Space Institute, Technical University of Denmark2

Language: English
Year: 2000
Pages: 626-638
Proceedings: SPIE meeting
Types: Conference paper
ORCIDs: Christensen, Finn Erland

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Analysis