Conference paper
Hard X-ray characterisation of a HEFT single reflection prototype
Language: | English |
---|---|
Year: | 2000 |
Pages: | 626-638 |
Proceedings: | SPIE meeting |
Types: | Conference paper |
ORCIDs: | Christensen, Finn Erland |
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Conference paper
Language: | English |
---|---|
Year: | 2000 |
Pages: | 626-638 |
Proceedings: | SPIE meeting |
Types: | Conference paper |
ORCIDs: | Christensen, Finn Erland |
Analysis