About

Log in?

DTU users get better search results including licensed content and discounts on order fees.

Anyone can log in and get personalized features such as favorites, tags and feeds.

Log in as DTU user Log in as non-DTU user No thanks

DTU Findit

Conference paper

Benchmarking five computational methods for analyzing large photonic crystal membrane cavities

From

Department of Photonics Engineering, Technical University of Denmark1

Zuse Institute Berlin2

Quantum and Laser Photonics, Department of Photonics Engineering, Technical University of Denmark3

Nanophotonic Devices, Department of Photonics Engineering, Technical University of Denmark4

Metamaterials, Department of Photonics Engineering, Technical University of Denmark5

Department of Mechanical Engineering, Technical University of Denmark6

Solid Mechanics, Department of Mechanical Engineering, Technical University of Denmark7

Department of Electrical Engineering, Technical University of Denmark8

Electromagnetic Systems, Department of Electrical Engineering, Technical University of Denmark9

St. Petersburg National Research University of Information Technologies, Mechanics and Optics (ITMO)10

...and 0 more

We benchmark five state-of-the-art computational methods by computing quality factors and resonance wavelengths in photonic crystal membrane L5 and L9 line defect cavities. The convergence of the methods with respect to resolution, degrees of freedom and number of modes is investigated. Convergence is not obtained for some of the methods, indicating that some are more suitable than others for analyzing line defect cavities.

Language: English
Publisher: IEEE
Year: 2017
Pages: 89-90
Proceedings: 17th International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD17)
ISBN: 1509053239 , 1509053247 , 9781509053230 and 9781509053247
ISSN: 21583242 and 21583234
Types: Conference paper
DOI: 10.1109/NUSOD.2017.8010005
ORCIDs: Gregersen, Niels , Frandsen, Lars Hagedorn , Lavrinenko, Andrei , Mørk, Jesper , Wang, Fengwen , Sigmund, Ole , Kim, Oleksiy S. and Breinbjerg, Olav

DTU users get better search results including licensed content and discounts on order fees.

Log in as DTU user

Access

Analysis