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1 Conference paper

Quantitative XPS analysis of thin iron-oxide films: effect of electron scattering

Graat, P.C.J.; Somers, Marcel A. J.

Ecasia 97 — 1997, pp. 805-808

Over the last decade Tougaard et al. (see e.g. Ref. 1) provided a formalism to calculate the contribution of inelastically scattered electrons to an XPS or AES spectrum. In that formalism it was assumed that the signal electrons move along straight lines to the surface. Recently, Werner et al

Year: 1997

Language: English

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kfpbocja dnhl meig
2 Journal article

Quantitative analysis of overlapping XPS peaks by spectrum reconstruction: determination of the thickness and composition of thin iron oxide films

Graat, Peter C.J.; Somers, Marcel A. J.

Surface and Interface Analysis — 1998, Volume 26, Issue 11, pp. 773-782

The composition and thickness of thin iron oxide iron were evaluated from Fe 2p spectra as measured by X-ray photoelectron spectroscopy. To this end the experimental spectra were reconstructed from reference spectra of the constituents Fe/sup 0/, Fe/sup 2+/ and Fe/sup 3+/. The background

Year: 1998

Language: English

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