Conference paper
Nanorobotic manipulation setup for pick-and-place handling and nondestructive characterization of carbon nanotubes
Division Microrobotics and Control Engineering, University of Oldenburg, 26111 Oldenburg, Germany1
NanoDTU, Department of Micro and Nanotechnology (MIC), Technical University of Denmark, DK-2800 Kgs. Lyngby, Denmark2
A nanorobotic manipulation setup for the handling and characterization of carbon nanotubes (CNTs) is presented. The nanorobotic setup can be integrated into a scanning electron microscope (SEM) and various endeffectors may be attached to the manipulator either for CNT handling or characterization. The pick-and-place task is carried out by using an electrothermal actuated microgripper, designed for controlled manipulation of nanotubes.
The nanotube is picked up from an array of multiwalled carbon nanotubes (MWCNTs) and transferred to the tip of an atomic force microscope (AFM) probe in order to assemble a high-aspect ratio AFM supertip. Another application of the nanorobotic setup considered in this paper is the nondestructive mechanical characterization of CNTs.
A piezoresistive AFM probe is used to bend MWCNTs, while the bending force is measured, in order to estimate the Young’s modulus of the investigated MWCNTs.
| Language: | English |
|---|---|
| Year: | 2007 |
| Pages: | 291-296 |
| ISBN: | 142440911X , 142440911x , 1424409128 , 9781424409112 and 9781424409129 |
| Types: | Conference paper |
| DOI: | 10.1109/IROS.2007.4398979 |
AFM supertip Assembly Atomic force microscopy Atomic measurements Carbon nanotubes Electrothermal effects Force measurement Grippers Piezoresistance Probes SEM Scanning electron microscopy Young's modulus Youngs modulus atomic force microscope atomic force microscopy bending bending force carbon nanotubes electrothermal actuated microgripper end effectors endeffectors grippers manipulator micromanipulators multiwalled carbon nanotubes nanorobotic manipulation setup nanotechnology nondestructive mechanical characterization pick-and-place handling piezoresistive AFM probe scanning electron microscope scanning electron microscopy
