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Journal article ยท Ahead of Print article

Intensity Noise Transfer Through a Diode-pumped Titanium Sapphire Laser System

From

Optofluidics, Nano and Bio-physical Systems, Department of Health Technology, Technical University of Denmark1

Department of Health Technology, Technical University of Denmark2

Department of Photonics Engineering, Technical University of Denmark3

Diode Lasers and LED Systems, Department of Photonics Engineering, Technical University of Denmark4

Ferdinand-Braun-Institut5

In this paper, we investigate the noise performance and transfer in a titanium sapphire (Ti:S) laser system. This system consists of a DBR tapered diode laser, which is frequency doubled in two cascaded nonlinear crystals and used to pump the Ti:S laser oscillator. This investigation includes electrical noise characterizations of the utilized power supplies, the optical noise of the fundamental light, the second harmonic light, and finally the optical noise of the femtosecond pulses emitted by the Ti:S laser.

Noise features originating from the electric power supply are evident throughout the whole transfer chain. It is demonstrated that improving the electrical noise provides an easy method for reducing the relative intensity noise (RIN) in all stages. The frequency doubled light is shown to have a higher RIN than the fundamental light.

In particular, the cascaded system is seen to exhibit higher RIN than a setup with only a single nonlinear crystal. The Ti:S is shown to have a cut-off frequency around 500 kHz, which means that noise structures of the pump laser above this frequency are strongly suppressed. Finally, the majority of the Ti:S noise seems to originate from the laser itself, which partly can be explained by the effect of relaxation oscillation frequency.

Language: English
Publisher: IEEE
Year: 2018
Pages: 1-1
ISSN: 15581713 and 00189197
Types: Journal article and Ahead of Print article
DOI: 10.1109/JQE.2017.2777860
ORCIDs: Tawfieq, Mahmoud , Hansen, Anders Kragh , Jensen, Ole Bjarlin , Marti, Dominik and Andersen, Peter E.

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