Conference paper
Widely Tunable, Fast Scanning, Narrow Linewidth, Mid-IR Source Centred at 2.9 μm
A mid-IR source based on difference frequency generation is shown capable of performing a 100 nm wide scan centred at 2.9 μm in under 3 minutes. Its use for measuring the quality factors of photonic crystal cavities is demonstrated.
Language: | English |
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Publisher: | IEEE |
Year: | 2020 |
Pages: | 1-2 |
Proceedings: | 2020 Conference on Lasers and Electro-Optics (CLEO) |
ISBN: | 1728144183 , 1943580766 , 9781728144184 and 9781943580767 |
Types: | Conference paper |
ORCIDs: | Kelleher, Edmund |