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Journal article

Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

By Snigirev, O.V.1; Andreev, K.E.1; Tishin, A.M.1; Gudoshnikov, S.A.2; Bohr, Jakob3,4

From

Lomonosov Moscow State University1

Russian Academy of Sciences2

Computational Atomic-scale Materials Design, Department of Physics, Technical University of Denmark3

Department of Physics, Technical University of Denmark4

We have applied a scanning HTS (high-temperature superconductor) de SQUID (superconducting quantum interference device) -based magnetic microscope to study the magnetic properties of Au/Ni/Si(100) films in the thickness range from 8 to 200 Angstrom at T = 77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 Angstrom.

A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 Angstrom.

Language: English
Year: 1997
Pages: 14429-14433
ISSN: 1550235x , 10980121 , 24699950 , 10953795 and 01631829
Types: Journal article
DOI: 10.1103/PhysRevB.55.14429
Keywords

ANISOTROPY BCC BEHAVIOR CO CROSSOVER INPLANE MONOLAYERS MULTILAYERS SURFACE ULTRATHIN FILMS

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