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Interpreted as:
journal:(Microelectronics AND Reliability) AND title:(Simulated AND SAM AND A-scans AND on AND multilayer AND MEMS AND components)
Suggestions: Include records that partially match the query
Simulated SAM A-scans on multilayer MEMS components
Microelectronics Reliability — 2002, Volume 42, Issue 9-11, pp. 1811-1814
Year: 2002
Language: English
Simulated SAM A-scans on multilayer MEMS components 10.1016/S0026-2714(02)00236-6
Microelectronics Reliability — 2002, Volume 42, Issue 9-11, pp. 1811-1814
Year: 2002
Language: English