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Journal article

X-ray grazing incidence diffraction from polycrystalline Sb films on single-crystal substrates

From

Risø National Laboratory for Sustainable Energy, Technical University of Denmark1

The intensity of Bragg reflections depends strongly on the angle of incidence, if a highly collimated beam of X-rays is impinging at grazing incidence on a thin (200-600 AA) polycrystalline antimony layer. In the case of asymmetric grazing incidence diffraction (AGID) the angle of incidence is small, as the exit angle must be large and nearly twice the Bragg angle.

The experimental data are analysed on the basis of the distorted wave Born approximation (DWBA), which yields the thickness d and the optical constants delta and beta of the layer. These parameters are compared with those determined from total external reflection data.

Language: English
Year: 1993
Pages: 8149-8158
ISSN: 1361648x and 09538984
Types: Journal article
DOI: 10.1088/0953-8984/5/44/008

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