Journal article ยท Conference paper
Box-scan: A novel 3DXRD method for studies of recrystallization and grain growth
Department of Transport, Technical University of Denmark1
Traffic modelling and planning, Department of Transport, Technical University of Denmark2
Department of Physics, Technical University of Denmark3
Neutrons and X-rays for Materials Physics, Department of Physics, Technical University of Denmark4
European Synchrotron Radiation Facility5
Naval Research Laboratory6
Department of Energy Conversion and Storage, Technical University of Denmark7
Imaging and Structural Analysis, Department of Energy Conversion and Storage, Technical University of Denmark8
Within the last decade a number of x-ray diffraction methods have been presented for non-destructive 3D characterization of polycrystalline materials. 3DXRD [1] and Diffraction Contrast Tomography [2,3,4] are examples of such methods providing full spatial and crystallographic information of the individual grains.
Both methods rely on specially designed high-resolution near-field detectors for acquire the shape of the illuminated grains, and therefore the spatial resolution is for both methods limited by the resolution of the detector, currently ~2 micrometers. Applying these methods using conventional far-field detectors provides information on centre of mass, crystallographic orientation and stress state of the individual grains [5], at the expense of high spatial resolution.
However, far-field detectors have much higher efficiency than near-field detectors, and as such are suitable for dynamic studies requiring high temporal resolution and set-ups involving bulky sample environments (e.g. furnaces, stress-rigs etc.)
Language: | English |
---|---|
Publisher: | Trans Tech Publications Ltd |
Year: | 2012 |
Pages: | 518-520 |
Proceedings: | 4th International Conference on Recrystallization and Grain GrowthInternational Conference on Recrystallization and Grain Growth |
ISSN: | 16629752 , 02555476 , 22976620 and 14226375 |
Types: | Journal article and Conference paper |
DOI: | 10.4028/www.scientific.net/MSF.715-716.518 |
ORCIDs: | Poulsen, Henning Friis |
6D Diffraction Space Box-Scan Non-Destructive Nuclei X-Ray Diffraction (XRD)