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Journal article

Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns

By Krieger Lassen, N.C.; Juul Jensen, Dorte1; Condradsen, K.1

From

Technical University of Denmark (Risø DTU), Center for Fundamental Research: Metal Structures in Four Dimensions, Materials Research Department, Risø National Laboratory, Frederiksborgvej 399, Roskilde, 40001

Language: English
Publisher: Trans Tech Publications Ltd
Year: 1994
Pages: 149-158
ISSN: 16629752 and 02555476
Types: Journal article
DOI: 10.4028/www.scientific.net/MSF.157-162.149
Keywords

Automation Classification Electron Back Scattering Patterns Fourier Transform Growth Rate Image Processing Recrystallization

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