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Conference paper

On the sensitivity of probe-corrected spherical near-field antenna measurements with high-order probes using double phi-step theta-scanning scheme against various measurement uncertainties

In Proceedings of the 5. European Conference on Antennas and Propagation — 2011, pp. 1810-1814
From

Department of Electrical Engineering, Technical University of Denmark1

Electromagnetic Systems, Department of Electrical Engineering, Technical University of Denmark2

In this paper, the relatively recently introduced double phi-step theta-scanning scheme and the probe correction technique associated with it is examined against the traditional phi-scanning scheme and the first-order probe correction. The important result of this paper is that the double phi-step theta-scanning scheme is shown to be clearly less sensitive to the probe misalignment errors compared to the phi-scanning scheme.

The two methods show similar sensitivity to noise and channel balance error.

Language: English
Publisher: IEEE
Year: 2011
Pages: 1810-1814
Proceedings: 5th European Conference on Antennas and Propagation
ISBN: 1457702509 , 9781457702501 , 8882020746 and 9788882020743
Types: Conference paper
ORCIDs: Breinbjerg, Olav

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