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Conference paper

The objective crystal spectrometer OXS on the spectrum-X-gamma satellite crystal calibrations

By Abdali, S.; Christensen, Finn Erland1,2; Schnopper, H.W.; Gerward, Leif3; Wiebicke, H.-J.; Halm, I.; Louis, E.; Voorma, H.-J.; Spiller, E.; Tarro, C.

From

National Space Institute, Technical University of Denmark1

Astrophysics, National Space Institute, Technical University of Denmark2

Department of Physics, Technical University of Denmark3

The four kinds of crystals; RAP(001), Si(111), LiF(220) and the Co/C multilayer on the super polished Si(111) crystals, together make up the objective crystal spectrometer OXS. They cover a wide energy range extending from 0.16 eV to 8 keV. A study of crystal reflectivity and energy resolution including measurements on RAP, LiF and Co/C and a calculation of Si crystals in the respective wavelength bands has been performed and the results are presented.

Language: English
Year: 1997
Pages: 358-372
Proceedings: EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII
ISSN: 1996756x and 0277786x
Types: Conference paper
DOI: 10.1117/12.283779
ORCIDs: Christensen, Finn Erland

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