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Journal article

Patterns in Listings of Failure-Rate & MTTF Values and Listings of Other Data

From

Technical University of Denmark1

Department of Electrical Engineering, Technical University of Denmark2

It has been observed that the decimal parts of failure-rate and MTTF values as listed in tables tend to have a logarithmic distribution. A possible explanation for this phenomenon is given. When such tables have been generated they should be examined to see if the anticipated distribution is present; should that not be the case, a systematic error might well be present.

Such testing is one practical application of the observation. The decimal-values from long lists of data quite often tend to have a logarithmic distribution as pointed out by Newcomb and Benford. The phenomenon may be explained in several different ways, depending upon the nature of the data. References to their papers and those by other authors are given.

The reader may turn to tables in his own field of interest; such tables will in all likelihood also show the same regularity.

Language: English
Publisher: IEEE
Year: 1982
Pages: 132-134
ISSN: 15581721 and 00189529
Types: Journal article
DOI: 10.1109/TR.1982.5221273

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