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Interpreted as:

title:(Transient AND Measurements AND with AND a AND Photoconductively AND Gated AND Scanning AND Tunneling AND Microscope)

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1 Book chapter

Transient Measurements with a Photoconductively Gated Scanning Tunneling Microscope

Keil, Ulrich Dieter Felix; Jensen, Jacob Riis; Hvam, Jørn Marcher

International Topical Meeting on Microwave Photonics. Mwp '97, Technical Digest — 1997, pp. 285-287

Year: 1997

Language: English

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2 Conference paper

Transient Measurements With A Photoconductively Gated Scanning Tunneling Microscope

Keil, U.D.; Jensen, J.R.; Hvam, J.M.

International Topical Meeting on Microwave Photonics (mwp1997) — 1997, pp. 285,286,287

Year: 1997

Language: English

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