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Conference paper

X-ray spectrometry in ESEM and LVSEM: Corrections for beam skirt effects

In Proceedings. Forty-ninth Annual Meeting. the Scandinavian Society for Electron Microscopy — 1997, pp. 12-15

Edited by Thölén, A.R.

From

Risø National Laboratory for Sustainable Energy, Technical University of Denmark1

Language: English
Publisher: SCANDEM-97
Year: 1997
Pages: 12-15
Proceedings: SCANDEM 97
Types: Conference paper

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Analysis