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Journal article

An Up-scalable, Infiltration-Based Approach for Improving the Durability of Ni/YSZ Electrodes for Solid Oxide Cells

From

Department of Energy Conversion and Storage, Technical University of Denmark1

Solid State Chemistry, Department of Energy Conversion and Storage, Technical University of Denmark2

Electrochemistry, Department of Energy Conversion and Storage, Technical University of Denmark3

Continuum Modelling and Testing, Department of Energy Conversion and Storage, Technical University of Denmark4

In solid oxide electrolysis cells (SOECs), considerable degradation of the Ni/YSZ electrode during long-term electrolysis operation at high current densities (-1 A cm(-2) or above) has been an ongoing challenge. In this work we report on a method alleviating the problem based on infiltrating nano-sized electrocatalysts into the Ni/YSZ electrode of a full cell after it has been reduced in a "one-atmosphere-reduction" process.

The performance and durability of infiltrated and non-infiltrated cells are evaluated at full test-cell size of 4 x 4 cm(2) level. The infiltrated cell exhibits significantly enhanced durability when operated for steam electrolysis at 750 degrees C under high current densities, with cell voltage degradation rates of 0.028 V kh(-1) (2.0% kh(-1)) for 800 h at -1.25 A cm(-2) and 0.010 V kh(-1) (0.8% kh(-1)) for 300 h at -1.00 A cm(-2).

These degradation rates are similar to 14 times and similar to 25 times smaller than those of the non-infiltrated cell, respectively. The infiltrated cell also shows superior durability to the non-infiltrated cell during reversible operation. These results demonstrate the great potential of boosting the durability of state-of-the-art Ni/YSZ fuel electrodes for electrolysis operation via this infiltration-based approach. (c) 2020 The Electrochemical Society ("ECS").

Published on behalf of ECS by IOP Publishing Limited.

Language: English
Year: 2020
Pages: 024519
ISSN: 19457111 and 00134651
Types: Journal article
DOI: 10.1149/1945-7111/ab6f5c
ORCIDs: Tong, Xiaofeng , Hendriksen, Peter Vang , Hauch, Anne , Sun, Xiufu and Chen, Ming

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