Journal article
X-ray characterization of a SrTiO3 bicrystal interface
We studied a SrTiO3 bicrystal with X-ray diffraction. It was prepared by fusing two iron doped crystals, with 18.4 degrees miscut from the (001) direction along the [100] azimuth, at elevated pressure and temperature. This miscut corresponds to a (103) orientation of the interface and surface. One of the crystals has been polished to a thickness of 10 mu m to make the interface accessible to the synchrotron X-ray beams.
Crystal truncation rod scattering was used to study the structure of the interface. Our results show a very narrow interface region with a thickness of about 11 Angstrom and a significantly changed atomic structure.
Language: | English |
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Year: | 1996 |
Pages: | 875-878 |
ISSN: | 18792758 and 00396028 |
Types: | Journal article |
DOI: | 10.1016/0039-6028(95)01291-5 |