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Conference paper

Ultrafast terahertz scanning tunneling microscopy with atomic resolution

By Jelic, Vedran1; Iwaszczuk, Krzysztof2,3; Nguyen, Peter H.1; Rathje, Christopher4; Hornig, Graham J.1; Sharum, Haille M.1; Hoffman, James R.1; Freeman, Mark R.1; Hegmann, Frank A.1

From

University of Alberta1

Department of Photonics Engineering, Technical University of Denmark2

Ultrafast Infrared and Terahertz Science, Department of Photonics Engineering, Technical University of Denmark3

University of Göttingen4

We demonstrate that ultrafast terahertz scanning tunneling microscopy (THz-STM) can probe single atoms on a silicon surface with simultaneous sub-nanometer and sub-picosecond spatio-temporal resolution. THz-STM is established as a new technique for exploring high-field non-equilibrium tunneling phenomena with single atom precision.

Language: English
Publisher: Optical Society of America (OSA)
Year: 2016
Proceedings: Frontiers in Optics 2016
Series: Optics Infobase Conference Papers
ISBN: 1943580197 and 9781943580194
ISSN: 21622701
Types: Conference paper
DOI: 10.1364/FIO.2016.FF3F.2
Keywords

Atomic resolution Atoms Electronic, Optical and Magnetic Materials Mechanics of Materials Non equilibrium Picoseconds Scanning tunneling microscopy Silicon surfaces Single atoms Spatio-temporal resolution Sub nanometers Tunneling phenomena

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