Journal article
Quality assurance of fluorescence peak intensities in EDXRF analysis of environmental samples
A quality assurance methodology based on the Analysis of Precision was applied to results obtained by EDXRF. It was found that statistical control could be achieved in the processing of X-ray spectra with the program MicroSAMPO and an optimized Covell program, but not with a conventional Gaussian fitting program.
Final results were consistent with an a priori precision of approximately 1% from the sample preparation stage, and no significant uncertainty could be attributed to the backscatter/fundamental parameter approach to the quantification. The method under investigation was found suitable for the analysis of environmental samples from chromium-contaminated grounds.
Language: | English |
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Year: | 1990 |
Pages: | 562-566 |
ISSN: | 18729576 and 01689002 |
Types: | Journal article |
DOI: | 10.1016/0168-9002(90)90844-V |