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Journal article

Numerical correction of aberrations via phase retrieval with speckle illumination

From

Optical Sensor Technology, Department of Photonics Engineering, Technical University of Denmark1

Department of Photonics Engineering, Technical University of Denmark2

Teraherts Technologies and Biophotonics, Department of Photonics Engineering, Technical University of Denmark3

What we believe to be a novel technique for wavefront aberration measurement using speckle patterns is presented. The aberration correction is done numerically. A tilted lens is illuminated with a partially developed speckle field, and the transmitted light intensity is sampled at axially displaced planes.

The speckle intensity patterns are then sent to a phase-retrieval algorithm to reconstruct the complete wavefront. The nature of the wavefront aberration is determined through Zernike polynomials. Numerical correction of the perturbed wavefront is performed based on rms error and the Strehl ratio. Restoration of the wavefront from a phase object with high spatial frequency content shows the effectiveness of our method. (C) 2009 Optical Society of America

Language: English
Year: 2009
Pages: 521-523
ISSN: 15394794 and 01469592
Types: Journal article
DOI: 10.1364/OL.34.000521
ORCIDs: Hanson, Steen Grüner

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