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Journal article

Residual Strain Profiles in Alumina-Zirconia Ceramic Composites

By Ruiz-Hervias, Jesus2; Steuwer, Axel3; Gurauskis, Jonas4; Buslaps, Thomas5; Baudín, Carmen1

From

Instituto de Cerámica y Vidrio, CSIC, Campus de Cantoblanco, Kelsen 5, Madrid, 2804591

Universidad Politécnica de Madrid, Departamento de Ciencia de Materiales, E.T.S. Ingenieros Caminos, Canales y Puertos, Profesor Aranguren s/n, Madrid, 280802

ESS Scandinavia, Stora Algatan 4, Lund, 223503

CSIC-Universidad de Zaragoza, Instituto de Ciencia de Materiales de Aragón, Departamento de Ciencia de Materiales e Ingeniería Metalúrgica, C/Pedro Cerbuna 12, Zaragoza, 500184

ESRF European Synchrotron Radiation Facility, 6 Rue Jules Horowitz, BP 220, Grenoble Cedex 9, 380425

Residual strain profiles were measured by synchrotron X-ray radiation in Al2O3/Y-stabilized ZrO2 (YSZ) ceramic laminates. Different stacking sequences were employed, including alternating layers containing 5 and 40 vol.% YSZ. Residual strains were found to be fairly constant within each layer; although they change at the interface between layers with different compositions.

Different behaviour is observed for the strains along the in-plane and normal directions.

Language: English
Publisher: Trans Tech Publications Ltd
Year: 2010
Pages: 57-62
ISSN: 16629752 and 02555476
Types: Journal article
DOI: 10.4028/www.scientific.net/MSF.652.57
Keywords

Ceramic Layered Composite Neutron Diffraction Residual Stress Synchrotron X-Ray Diffraction Tape Casting

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