Journal article
Polarization resolved imaging with a reflection near-field optical microscope
Using a rigorous microscopic point-dipole description of probe-sample interactions, we study imaging with a reflection scanning near-field optical microscope. Optical content, topographical artifacts, sensitivity window-i.e., the scale on which near-field optical images represent mainly optical contrast-and symmetry properties are considered for optical images obtained in constant-distance mode for different polarization configurations.
We demonstrate that images obtained in cross-polarized detection mode are free of background and topographical artifacts and that the cross-circular polarization configuration is preferable to the cross-linear one, since it ensures more isotropic (in the surface plane) near-field imaging of surface features.
The numerical results are supported with experimental near-field images obtained by using a reflection microscope with an uncoated fiber tip.
Language: | English |
---|---|
Year: | 1999 |
Pages: | 2649-2657 |
ISSN: | 15208532 and 10847529 |
Types: | Journal article |
DOI: | 10.1364/JOSAA.16.002649 |
ORCIDs: | Hvam, Jørn Märcher |