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10 items by relevance
1 Book chapter

Optical Vortex Metrology

Wang, Wei; Hanson, Steen Grüner; Takeda, Mitsuo

Advances in Speckle Metrology and Related Techniques — 2011, pp. 207-238

Year: 2011

Language: English

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2 Book chapter

Positional Accuracy of Optical Vortex Metrology (OVM)

Beyer, Vivien; Wang, Wei; Moore, Andrew J.

Fringe 2013 — 2014, pp. 329-332

Conventional correlation-based tracking methods are limited by the correlation window size and a lack in ability to track individual speckles or particles. Wang et al.[1] in their definition of Optical Vortex Metrology (OVM) propose that phase singularities are optimal encoders for position marking

Year: 2014

Language: English

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3 Conference paper

Optical vortex metrology for nano and bio measurement

Wang, W.; Hanson, Steen Grüner; Takeda, M.

Programme — 2008

Year: 2008

Language: English

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4 Conference paper

Optical vortex metrology for non-destructive testing: [invited]

Wang, W.; Hanson, Steen Grüner

Conference Abstract Series, Cleo/europe - Eqec — 2009, pp. 1-1

Based on the phase singularities in optical fields, we introduce a new technique, referred to as Optical Vortex Metrology, and demonstrate its application to nano- displacement, flow measurements and biological kinematic analysis.

Year: 2009

Language: English

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5 Journal article

Optical vortex metrology for nanometric speckle displacement measurement

Wang, Wei; Yokozeki, Tomoaki; Ishijima, Reika; Wada, Atsushi; Miyamoto, Yoko; Takeda, Mitsuo; et al. (1 more)

Optics Express — 2006, Volume 14, Issue 1, pp. 120-127

is generated by vortex filtering the speckle pattern. Experimental results are presented that demonstrate the validity and the performance of the proposed optical vortex metrology with nano-scale resolution.

Year: 2006

Language: English

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6 Journal article

Optical vortex metrology for nanometric speckle displacement measurement

Wang, W.; Yokozeki, T.; Ishijima, R.; Wada, A.; Miyamoto, Y.; Takeda, M.; et al. (1 more)

Opt. Express — 2006, Volume 14, pp. 120-127

Year: 2006

Language: English

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7 Conference paper

Optical vortex metrology: Displacement and flow measurements with phase singularities

Takeda, M.; Wang, W.; Hanson, Steen Grüner; Miyamoto, Y.

Aip Conference Proceedings — 2007, pp. 185-191

Year: 2007

Language: English

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8 Other

Optical Vortex Metrology: Displacement and Flow Measurements with Phase Singularities

Takeda, Mitsuo; Wang, Wei; Hanson, Steen G.; Miyamoto, Yoko

Aip Conference Proceedings — 2007, Volume 949, Issue 1, pp. 185-191

We review the principle and the applications of a new technique which we recently proposed for displacement and flow measurements. The technique is called optical vortex metrology because it makes use of phase singularities in the complex signal as markers or tracers, which are generated

Year: 2007

Language: Undetermined

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9 Conference paper

Sub-pixel speckle displacement measurement by using Optical Vortex Metrology

Wang, W.; Yokozeki, T.; Ishijima, R.; Wada, A.; Hanson, Steen Grüner; Miyamoto, Y.; et al. (1 more)

Speckles, From Grains To Flowers. Proceedings — 2006

Year: 2006

Language: English

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10 Conference paper

Optical vortex metrology: Are phase singularities foes or friends in optical metrology?

Takeda, M.; Wang, W.; Hanson, Steen Grüner; Miyamoto, Y.

Proceedings — 2008

We raise an issue whether phase singularities are foes or friends in optical metrology, and give an answer by introducing the principle and applications of a new technique which we recently proposed for displacement and flow measurements. The technique is called optical vortex metrology because

Year: 2008

Language: English

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