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The Focused Ion Beam – Scanning Electron Microscope: A tool for sample preparation, two and three dimensional imaging

By Bowen, Jacob R.1,2

From

Department of Energy Conversion and Storage, Technical University of Denmark1

Imaging and Structural Analysis, Department of Energy Conversion and Storage, Technical University of Denmark2

Language: English
Year: 2015
Proceedings: DTU Energy Conversion 2nd International PhD Summer School
Types: Other
ORCIDs: 0000-0003-2762-4449

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Analysis