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journal:(Chemical AND Physics AND Letters) AND title:(A AND novel AND growth AND mode AND of AND alkane AND films AND on AND a AND SiO2 AND surface)

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1 Journal article

A novel growth mode of alkane films on a SiO2 surface

Synchrotron X-ray specular scattering measurements confirm microscopically a structural model recently inferred by very-high-resolution ellipsometry of a solid dotriacontane (n-C32H66 or C32) film formed by adsorption from solution onto a SiO2 surface. Sequentially, one or two layers adsorb

Year: 2003

Language: English

ba fmcplegoj ndkih
2 Journal article

A novel growth mode of alkane films on a SiO2 surface

Synchrotron X-ray specular scattering measurements confirm microscopically a structural model recently inferred by very-high-resolution ellipsometry of a solid dotriacontane (n-C32H66 or C32) film formed by adsorption from solution onto a SiO2 surface. Sequentially, one or two layers adsorb

Year: 2003

Language: English

kap hefdjcibn glom

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