Journal article
Length scale effect on the deformation microstructures of grown-in twins in copper
Electrodeposited copper samples composed of columnar grains subdivided by alternating twin/matrix (T/M) lamellae have been cold rolled to 30-85% reduction in thickness. The thickness of the T/M lamellae varies over a wide range from a few nanometres to about 1 m. The deformation microstructure has been characterized systematically.
In thin T/M lamellae (below 50-100 nm) the deformation behaviours differ significantly from that of thick T/M lamellae, as the dislocation activity is concentrated at the T/M boundaries illustrated by the observations of stacking faults and Shockley partial dislocations. In thick T/M lamellae (100-1000 nm), the deformation microstructure is related to the grain orientation as also observed previously in deformed single crystals and polycrystals with a grain size at the micrometre scale.
The experiment therefore suggests that the universal structural characteristics of deformation microstructure can be extended one order of magnitude from about 5 m to the sub-micrometre scale (about 0.5 m). © 2014 Taylor & Francis.
Language: | English |
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Publisher: | Taylor & Francis |
Year: | 2014 |
Pages: | 2262-2280 |
ISSN: | 14786443 and 14786435 |
Types: | Journal article |
DOI: | 10.1080/14786435.2014.913106 |
ORCIDs: | Huang, Xiaoxu |
Cold rolling Crystal orientation Deformation Deformation behaviour Deformation microstructure Dislocation structures Electrodeposited copper Metal cladding Microstructure Nano scale Shockley partial dislocations Structural characteristics TEM Transmission electron microscopy crystal orientation dislocation structures nanoscale twin thickness