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Journal article

Subsurface excitations in a metal

By Ray, M. P.1; Lake, R. E.; Sosolik, C. E.; Thomsen, Lasse Bjørchmar2; Nielsen, Gunver2; Chorkendorff, Ib2,3; Hansen, Ole4,5,6

From

Clemson University1

Department of Physics, Technical University of Denmark2

Surface Physics and Catalysis, Department of Physics, Technical University of Denmark3

Silicon Microtechnology Group, MicroElectroMechanical Systems Section, Department of Micro- and Nanotechnology, Technical University of Denmark4

MicroElectroMechanical Systems Section, Department of Micro- and Nanotechnology, Technical University of Denmark5

Department of Micro- and Nanotechnology, Technical University of Denmark6

We investigate internal hot carrier excitations in a Au thin film bombarded by hyperthermal and low energy alkali and noble gas ions. Excitations within the thin film of a metal-oxide-semiconductor device are measured revealing that ions whose velocities fall below the classical threshold given by the free-electron model of a metal still excite hot carriers.

Excellent agreement between these results and a nonadiabatic model that accounts for the time-varying ion-surface interaction indicates that the measured excitations are due to semilocalized electrons near the metal surface.

Language: English
Year: 2009
ISSN: 1550235x , 10980121 and 01631829
Types: Journal article
DOI: 10.1103/PhysRevB.80.161405
ORCIDs: Chorkendorff, Ib and Hansen, Ole
Keywords

CLEAN POLYCRYSTALLINE GOLD ENERGY ION-BEAMS KINETIC ELECTRON-EMISSION SOLIDS SURFACES

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