Journal article
Critical current density measurement of thin films by AC susceptibility based on the penetration parameter h
Department of Energy Conversion and Storage, Technical University of Denmark1
Electrofunctional materials, Department of Energy Conversion and Storage, Technical University of Denmark2
Department of Wind Energy, Technical University of Denmark3
Wind Energy Systems, Department of Wind Energy, Technical University of Denmark4
Department of Physics, Technical University of Denmark5
Neutrons and X-rays for Materials Physics, Department of Physics, Technical University of Denmark6
We have numerically proved that the dependence of AC susceptibility χ of a E(J) power law superconducting thin disc on many parameters can be reduced to one penetration parameter h, with E the electric field and J the current density. Based on this result, we propose a way of measuring the critical current density Jc of superconducting thin films by AC susceptibility.
Compared with the normally used method based on the peak of the imaginary part, our method uses a much larger range of the AC susceptibility curve, thus allowing determination of the temperature (T) dependence of Jc from a normally applied χ(T) measurement. A fitting equation Jc=1.9Ha∣χ′∣0.69/d, −0.4
| Language: | English |
|---|---|
| Year: | 2012 |
| Pages: | 6-14 |
| ISSN: | 18732143 and 09214534 |
| Types: | Journal article |
| DOI: | 10.1016/j.physc.2012.02.032 |
| ORCIDs: | Grivel, Jean-Claude and Abrahamsen, Asger B. |
