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Journal article ยท Conference paper

Charging of Thin Film Phase Plates under Electron Beam Irradiation

From

National Institute of Nanotechnology1

Center for Electron Nanoscopy, Technical University of Denmark2

JEOL Ltd.3

Language: English
Publisher: Cambridge University Press
Year: 2014
Pages: 230-231
Proceedings: Microscopy and Microanalysis 2014
ISSN: 14358115 and 14319276
Types: Journal article and Conference paper
DOI: 10.1017/S1431927614002876
ORCIDs: Beleggia, Marco

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