About

Log in?

DTU users get better search results including licensed content and discounts on order fees.

Anyone can log in and get personalized features such as favorites, tags and feeds.

Log in as DTU user Log in as non-DTU user No thanks

DTU Findit

Conference paper

The interface structure of directly bonded Si(001) wafers, studied by X-ray diffraction

In Programme and Abstracts — 1999
From

Risø National Laboratory for Sustainable Energy, Technical University of Denmark1

Language: English
Publisher: Institute of Physics
Year: 1999
Proceedings: Condensed matter and materials physics conference (CMMP '99)
Types: Conference paper

DTU users get better search results including licensed content and discounts on order fees.

Log in as DTU user

Access

Analysis