Conference paper
Scanning second-harmonic optical microscopy of self-assembled InAlGaAs quantum dots
Microscopy provides a suitable technique for local probing of small ensembles of (or even individual) QD's, and when combined with the detection of second-harmonic (SH) generation the technique becomes suitable to reveal tiny changes of symmetry originating either in the material structures or in the illumination itself.
Thus, a combination of scanning microscopy with SH detection may be a highly suitable candidate to reveal the presence of QD's embedded in an otherwise isotropic material. We have used scanning far-field (SFOM) and scanning near field optical microscopy (SNOM) techniques to locally probe small ensembles of self-assembled InAlGaAs QD's.
| Language: | English |
|---|---|
| Publisher: | Opt. Soc. America |
| Year: | 2001 |
| Pages: | 135 |
| Proceedings: | 2001 Quantum Electronics and Laser Science Conference |
| ISBN: | 155752663X , 155752663x and 9781557526632 |
| Types: | Conference paper |
| DOI: | 10.1109/QELS.2001.961958 |
| ORCIDs: | Hvam, Jørn Märcher |
III-V semiconductors InAlGaAs Lighting Nonlinear optics Optical filters Optical materials Optical microscopy Optical mixing Probes Quantum dots SH detection SNOM US Department of Transportation Wavelength measurement aluminium compounds gallium arsenide indium compounds local probing near-field scanning optical microscopy optical harmonic generation scanning far-field optical microscopy scanning microscopy scanning near field optical microscopy scanning second-harmonic optical microscopy second-harmonic generation self-assembled InAlGaAs quantum dots self-assembly semiconductor quantum dots small ensembles symmetry
