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Journal article

Low-frequency noise in planar Hall effect bridge sensors

From

Uppsala University1

MEMS-AppliedSensors Group, MicroElectroMechanical Systems Section, Department of Micro- and Nanotechnology, Technical University of Denmark2

MicroElectroMechanical Systems Section, Department of Micro- and Nanotechnology, Technical University of Denmark3

Department of Micro- and Nanotechnology, Technical University of Denmark4

The low-frequency characteristics of planar Hall effect bridge sensors are investigated as function of the sensor bias current and the applied magnetic field. The noise spectra reveal a Johnson-like spectrum at high frequencies, and a 1/f-like excess noise spectrum at lower frequencies, with a knee frequency of around 400Hz.

The 1/f-like excess noise can be described by the phenomenological Hooge equation with a Hooge parameter of γH=0.016. The detectivity is shown to depend on the total length, width and thickness of the bridge branches. The detectivity is improved by the square root of the length increase. Moreover, the detectivity is shown to depend on the amplitude of the applied magnetic field, revealing a magnetic origin to part of the 1/f noise.

Language: English
Year: 2011
Pages: 212-218
ISSN: 18733069 and 09244247
Types: Journal article
DOI: 10.1016/j.sna.2011.09.014
ORCIDs: Hansen, Mikkel Fougt

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