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Conference paper

Test-driven modeling and development of cloud-enabled cyber-physical smart systems

From

Department of Applied Mathematics and Computer Science, Technical University of Denmark1

Embedded Systems Engineering, Department of Applied Mathematics and Computer Science, Technical University of Denmark2

Embedded products currently tend to evolve into large and complex smart systems where products are enriched with services through clouds and other web technologies. The complex characteristics of smart systems make it very difficult to guarantee functionality, safety, security and performance. Using test-driven modeling (TDM) is likely to be the best way to design smart systems such that these qualities are ensured.

However, the TDM methods that are applied to development of simpler systems do not scale to smart systems because the modeling technologies cannot handle the complexity and size of the systems. In this paper, we present a method for test-driven modeling that scales to very large and complex systems.

The method uses a combination of formal verification of basic interactions, simulations of complex scenarios, and mathematical forecasting to predict system behavior and performance. We utilized the method to analyze, design and develop various scenarios for a cloud-enabled medical system. Our approach provides a versatile method that may be adapted and improved for future development of very large and complex smart systems in various domains.

Language: English
Publisher: IEEE
Year: 2017
Pages: 83-90
Proceedings: 11th Annual 2017 IEEE International Systems Conference
Series: Annual Ieee Systems Conference
ISBN: 1509046232 , 1509046240 , 9781509046232 and 9781509046249
ISSN: 24729647 and 19447620
Types: Conference paper
DOI: 10.1109/SYSCON.2017.7934714
ORCIDs: Munck, Allan and Madsen, Jan

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