Journal article · Conference paper
A three-dimensional X-ray diffraction microscope for deformation studies of polycrystals
The microstructure in polycrystalline materials has mostly been studied in planar sections by microscopy techniques. Now the high penetration power of hard X-ray synchrotron radiation makes three-dimensional (3-D) observations possible in bulk material by back tracing the diffracted beam. The three-dimensional X-ray diffraction (3DXRD) microscope installed at the European Synchrotron Radiation Facility in Grenoble provides a fast and non-destructive technique for mapping the embedded grains within thick samples in three dimensions.
All essential features like the position, volume, orientation, stress-state of the grains can be determined, including the morphology of the grain boundaries. The accuracy of this novel tracking technique is compared with electron microscopy (EBSP), and its 3-D capacity is demonstrated. (C) 2001 Elsevier Science B.V.
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Language: | English |
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Publisher: | [s.n.] |
Year: | 2000 |
Pages: | 179-181 |
Proceedings: | 12th International Conference on the Strength of Materials |
ISSN: | 18734936 and 09215093 |
Types: | Journal article and Conference paper |
DOI: | 10.1016/S0921-5093(01)01056-5 |
ORCIDs: | Juul Jensen, D. , Poulsen, H.F. and 0000-0001-5088-2396 |