About

Log in?

DTU users get better search results including licensed content and discounts on order fees.

Anyone can log in and get personalized features such as favorites, tags and feeds.

Log in as DTU user Log in as non-DTU user No thanks

DTU Findit

Conference paper

Closed Loop Fault Detectability Based on a Gap-metric

In Proceedings of 2018 Ieee Conference on Control Technology and Applications — 2018, pp. 380-85
From

Automation and Control, Department of Electrical Engineering, Technical University of Denmark1

Department of Electrical Engineering, Technical University of Denmark2

University of Duisburg-Essen3

Systems are often controlled using feedback loops. Fault diagnosis schemes are usually designed assuming that there is no feedback loop. Therefore fault diagnosis methods need to accommodate for the feedback loop. One such method is active fault diagnosis based on a fault signature system. This method is derived using the YJBK parametrisation, named after Youla, Jabr, Bongiorno and Kucera.

It uses the derived fault signature system to determine the detectability of possible faults in the system. Deriving the fault signature system requires knowledge about the controller. This paper demonstrates the possibility of estimating the detectability of faults in the fault signature system using a gap-metric.

The gap-metric has the advantage of only requiring knowledge about the plant. By using the gap-metric it is possible to estimate the detectability of faults without using information about the controller.

Language: English
Publisher: IEEE
Year: 2018
Pages: 380-85
Proceedings: 2018 IEEE Conference on Control Technology and Applications
ISBN: 1538676974 and 9781538676974
Types: Conference paper
DOI: 10.1109/CCTA.2018.8511620
ORCIDs: Sekunda, André Krabdrup and Niemann, Hans Henrik

DTU users get better search results including licensed content and discounts on order fees.

Log in as DTU user

Access

Analysis