Conference paper
Single and double side textured black silicon require different annealing conditions for optimal passivation with ALD Al2O3
Black silicon is an attractive surface for solar cells thanks to its intrinsic antireflective properties, however progress in surface passivation is required to exploit its full potential. Here, we present effective minority carrier lifetime measurements on single side textured, double side textured, and flat reference Si surfaces, passivated by AI2O3 with subsequent thermal activation.
Effective lifetime measurements revealed that the annealing time resulting in highest effective lifetime, and therefore in the lowest surface recombination velocity of the textured surface, is depending on whether the wafers are single or double side textured. It follows that optimization of passivation of black silicon lifetime samples needs to be carried out on samples with texturing on one or both sides, depending on the solar cell architecture of interest.
| Language: | English |
|---|---|
| Publisher: | IEEE |
| Year: | 2018 |
| Pages: | 3105-3107 |
| Proceedings: | 7th World Conference on Photovoltaic Energy Conversion |
| ISBN: | 1538685299 , 1538685302 , 9781538685297 and 9781538685303 |
| Types: | Conference paper |
| DOI: | 10.1109/PVSC.2018.8547760 |
| ORCIDs: | Iandolo, Beniamino , Davidsen, Rasmus Schmidt and Hansen, Ole |
Al<sub>2</sub>O<sub>3</sub> Aluminum oxide Annealing Passivation Photovoltaic cells Si Silicon Surface texture aluminium compounds annealing antireflection coatings atomic layer deposition black silicon black silicon lifetime samples carrier lifetime double side textured black silicon effective minority carrier lifetime measurements elemental semiconductors flat reference flat reference Si surfaces intrinsic antireflective properties minority carriers optimal passivation passivation silicon single side textured black silicon solar cells subsequent thermal activation surface passivation surface recombination surface recombination velocity textured surface
