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Journal article

A First/Third-Order Probe Correction Technique for Spherical Near-Field Antenna Measurements Using Three Probe Orientations

From

ElectroScience, Department of Electrical Engineering, Technical University of Denmark1

Department of Electrical Engineering, Technical University of Denmark2

A probe correction technique is described for spherical near-field antenna measurements based on sampling the near field for three probe orientations in each measurement direction. The technique applies to odd-order probes whose radiated field contains (significant) power only in the first (µ=±1) and thirdorder (µ=±3) azimuthal spherical modes.

The technique is ideally suited as an optional probe correction technique for high-accuracy measurements in existing measurement systems that employ a rectangular or square waveguide probe and the traditional first-order probe correction technique.

Language: English
Publisher: IEEE
Year: 2008
Pages: 1259-1268
ISSN: 15582221 and 0018926x
Types: Journal article
DOI: 10.1109/TAP.2008.922615
ORCIDs: Breinbjerg, Olav

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