About

Log in?

DTU users get better search results including licensed content and discounts on order fees.

Anyone can log in and get personalized features such as favorites, tags and feeds.

Log in as DTU user Log in as non-DTU user No thanks

DTU Findit

Journal article · Conference paper

Electron beam effects in high-resolution transmission electron microscopy investigations of catalytic nanoparticles

From

National Centre for Nano Fabrication and Characterization, Technical University of Denmark1

Nanocharacterization, National Centre for Nano Fabrication and Characterization, Technical University of Denmark2

Atomic-scale Materials Dynamics, Nanocharacterization, National Centre for Nano Fabrication and Characterization, Technical University of Denmark3

Department of Physics, Technical University of Denmark4

Computational Atomic-scale Materials Design, Department of Physics, Technical University of Denmark5

Center for Nanostructured Graphene, Centers, Technical University of Denmark6

High-resolution transmission electron microscopy (HRTEM) is a powerful tool for atomic scale investigations of catalytic nanoparticles. The dynamics of such catalytic nanoparticles are highly dependent on the environment: temperature, reactant gases and reactor pressure. It is possible to imitate such conditions in a transmission electron microscope (TEM).

Electron beam effects play a substantial role in the interpretation of data produced in TEM investigations. There is a trade-off between optimal signal-to-noise ratio (SNR) and minimal beam damage. The current model system consists of gold nanoparticles supported on cerium dioxide. The aforementioned studies elucidate how the nanoparticles undergo changes with observation time and reactant gases present, and surface events as function of dose rate, respectively.

Language: English
Publisher: Cambridge University Press
Year: 2021
Pages: 3348-3349
ISSN: 14358115 and 14319276
Types: Journal article and Conference paper
DOI: 10.1017/S143192762101151X
ORCIDs: Lomholdt, William Bang , Leth Larsen, Matthew Helmi , Núñez Valencia, Cuauhtémoc , Schiøtz, Jakob and Hansen, Thomas

DTU users get better search results including licensed content and discounts on order fees.

Log in as DTU user

Access

Analysis