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Journal article

Lateral and vertical quantification of spin-coated polymer films on silicon by TOF-SIMS, XPS, and AFM

From

Risø National Laboratory for Sustainable Energy, Technical University of Denmark1

Language: English
Year: 2002
Pages: 13114-13121
ISSN: 15205207 and 15206106
Types: Journal article
DOI: 10.1021/jp020069o
ORCIDs: Norrman, K. and Larsen, N.B.
Keywords

7-I poly

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Analysis